[PDF]    http://dx.doi.org/10.3952/lithjphys.48405

Open access article / Atviros prieigos straipsnis

Lith. J. Phys. 48, 341–348 (2008)


XPS AND OPTICAL PROPERTIES OF SOL–GEL PROCESSED VANADIUM PENTOXIDE FILMS
V. Bondarenkaa, S. Kačiulisb, Z. Martūnasa, A. Rėzaa, G.J. Babonasa, and A. Pašiškevičiusa
aSemiconductor Physics Institute, A. Goštauto 11, LT-01108 Vilnius, Lithuania
E-mail: bond@pfi.lt
bInstitute for the Study of Nanostructured Materials (ISMN-CNR), P.O.Box 10, I-00016 Monterotondo Scalo, Italy

Received 9 May 2008; revised 4 December 2008; accepted 4 December 2008

Vanadium pentoxide xerogels were prepared by using sol–gel technology. As-prepared samples of xerogels were heated up to 580 K in order to remove the bonded water. The chemical composition of xerogel samples and thin films has been studied by X-ray photoelectron spectroscopy (XPS). XPS data have shown that pure V2O5 compound was formed. After thermal treatment, in the XPS spectra the main changes occurred in the vicinity of the O 1s peak due to the removal of water from xerogel. The optical properties of V2O5 films were studied by optical transmission and spectroscopic ellipsometry. Ellipsometric measurements have been carried out in the spectral range of 0.5–5.0 eV at 300 K. The changes in the optical spectra were observed after thermal annealing of as-prepared xerogel samples. The obtained data have shown that thermal treatment of V2O5 thin films has strongly influenced the optical transitions involving both localized and higher-lying conduction bands.
Keywords: vanadium pentoxide films, sol–gel technology, optical properties, XPS
PACS: 79.60.-i, 81.20.Fw, 81.40.Tv, 82.70.Gg


VANADŽIO PENTOKSIDO SLUOKSNIŲ, PAGAMINTŲ ZOLIO–GELIO TECHNOLOGIJA, RENTGENO FOTOELEKTRONINIAI SPEKTRAI IR OPTINĖS SAVYBĖS
V. Bondarenkaa, S. Kačiulisb, Z. Martūnasa, A. Rėzaa, G.J. Babonasa, A. Pašiškevičiusa
aPuslaidininkių fizikos institutas, Vilnius, Lietuva
bNanosandaros medžiagų tyrimo institutas, Monterotondo Scalo, Italija

Vanadžio pentoksido kserogeliai paruošti naudojant zolio–gelio technologiją. Gauti kserogeliai buvo kaitinami iki 580 K, siekiant pašalinti iš jų surištą vandenį. Kserogelių ir plonųjų sluoksnių cheminė sudėtis tirta naudojant Rentgeno fotoelektronų spektroskopijos (RFS) metodą. RFS tyrimo rezultatai parodė, kad technologinio proceso metu tikrai susiformavo vanadžio pentoksido plonieji sluoksniai. Pagrindiniai RFS spektrų pokyčiai, po terminio apdorojimo pašalinant vandenį iš kserogelio, vyko O 1s smailėje. V2O5 plonųjų sluoksnių optinės savybės buvo tirtos optinės absorbcijos ir spektroskopinės elipsometrijos metodais. Elipsometriniai matavimai atlikti 0,5–5,0 eV fotonų energijos ruože esant 300 K temperatūrai. Pastebėti ir išanalizuoti optinių spektrų pokyčiai po kserogelio bandinių atkaitinimo. Gauti duomenys parodė, kad V2O5 sluoksnių terminis apdorojimas stipriai veikia optinius šuolius tarp lokalizuotų lygmenų ir aukščiau esančių laidumo juostų.


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